ZEISS Webinar: "Workflows for Assessing Electronic Devices - Using 3D X-Ray Microscopy and Nanoscale Tomography" ~ Uz-Tech Мир Технологии

четверг, 27 апреля 2023 г.

ZEISS Webinar: "Workflows for Assessing Electronic Devices - Using 3D X-Ray Microscopy and Nanoscale Tomography"

Invitation to our Webinar – May 4, 2023
Workflows for Assessing Electronic Devices - Using 3D X-Ray Microscopy and Nanoscale Tomography

Dear Mr. Blanlw,

Join our free webinar "Workflows for Assessing Electronic Devices - Using 3D X-Ray Microscopy and Nanoscale Tomography" on Thursday, May 4, 2023 from 1 p.m. to 2 p.m. (CST).

The Monitor is your visualization module for reports and therefore the most often used module. This webinar will walk through how to effectively utilize the generic reports readily available in PiWeb Monitor.

Highlights of the webinar:

X-ray Microscopy Optimizes Electronic Device and PCB Assessment
X-ray imaging complemented by additional correlative microscopy provides powerful NDT inspection
Reconstruction Deep Learning algorithms can contribute to the functional inspection of electronic components

We are looking forward to your participation in our free webinar.

Best Regards,

Your ZEISS Industrial Quality Solutions Team

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