Dear Blabla,
Don't miss our ZEISS Live Tech Reveal! on Thursday, February 27 from 2 to 3 pm (ET).
Join us for the first-ever ZEISS Live Tech Reveal USA where we’ll introduce you to the latest metrology and inspection technologies to join the ZEISS Superforce! In less than an hour, learn about seven new cutting-edge metrology and inspection technologies that support quality across the entire product lifecycle— from idea to iteration to innovation. Plus, get access to exclusive special offers just for attending this digital event! Gain insight into the metrology and inspection technologies shaping the market like: - First-ever two-in-one CMM and microscope
- CMM table that supports up to 5 tons
- Optical 3D scanning cell for fully automated measurement and inspection workflows
- Powerful X-Ray Microscope for X-ray vision with dual magnification
- High-accuracy CMM at a great price
- The latest software updates to increase data analysis speed and efficiency
Don’t miss your chance to be among the first to see and experience the latest in metrology and inspection during this online event.
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