ZEISS Webinar: "Assessing Electronics with Advanced 3D X-ray Imaging and Deep Learning" ~ Uz-Tech Мир Технологии

Invitation to our Webinar – April 11, 2024
Assessing Electronics with Advanced 3D X-ray Imaging and Deep Learning

Dear Mr. Blanlw,

Join our free webinar "Assessing Electronics with Advanced 3D X-ray Imaging and Deep Learning" on Thursday, April 11, 2024 from 11 a.m. to 12 p.m. (CST).

This webinar presents advanced workflows that combine 3D X-ray microscopy (XRM), nanoscale tomography and deep learning (DL) to generate a detailed visualization of the interior of electronic devices and assemblies to enable the study of internal components for failure analysis (FA). Newly developed techniques, such as the integration of DL-based algorithms for improving 3D image reconstruction and upscaling high-resolution data to large field of views, are discussed.

Highlights of the webinar:

Recent advancements in 3D X-ray imaging allow new FA workflows for electronic devices with the integration of 3D XRMs and nanoscale tomography.
These imaging workflows allow spatial resolution imaging of fine details within electronic devices without interfering with or destroying the root cause of failure.
Using deep learning-based algorithms for CT reconstruction allow for 3D XRM workflows to be applied much more economically by reducing the time required for data acquisition.
DL-based X-ray inspection technologies will have a significant impact on improving image quality and reducing time spent on testing and failure analysis of advanced electronic packages.

We are looking forward to your participation in our free webinar.

Best Regards,

Your ZEISS Industrial Quality Solutions Team

Would you like to keep receiving interesting news and information on products and services from Carl Zeiss Industrielle Messtechnik and other companies in the ZEISS Group ("ZEISS")?