Have you heard about the new generation of the ZEISS PRISMO family?

Discover the new generation of the ZEISS PRISMO family now!

 

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Quality Excellence News April 2023

ZEISS PRISMO Family – the new generation Finally, the time has come! We are pleased to present the next innovation: The new generation of the ZEISS PRISMO family is waiting to conquer the metrology world! You can look forward to the new features that will boost your performance and productivity. Join our launch session on April 25th and get to know the high-precision coordinate measuring machines. Launch event at 10:00 am (CDT)

ZEISS Xradia 630 Versa We listened to our customers and built in accessibility, greater productivity, and unheard-of capabilities for the newest ZEISS Xradia Versa X-ray microscope (XRM). Achieve the highest quality results at all user skill levels with a system that anticipates your user's next steps and requirements. Learn more about ZEISS Xradia 630 Versa. Find out more now

Powerful statistics and reporting with ZEISS PiWeb Our ZEISS PiWeb software helps to connect metrology results from different technologies to shop floor decisions. Totally technology-independent and made for big data, it enables you to perform GR&R studies, create powerful statistics and efficiently track your production quality! Interested in more? Check out more features in detail and book a demo! Book a demo

New: Computed Tomography Theory Class! This course covers the theoretical and practical background to X-ray Computed Tomography (CT). Topics include X-ray physics, system components, aspects of image quality, scanning parameters, and image analysis. The material will be presented in a format combining lecture and hands-on workshops. This first class is April 24-28 in Michigan. Reserve your spot! Book a class today!

ZEISS EVO – Automate and Correlate The latest generation ZEISS EVO brings all the benefits of a compact SEM, but with functionality, analytical options, data quality and connectivity not possible in a tabletop instrument. Click here to watch the video

Learn more about industrial microscopy with your local experts Visit  Midwest Metrology if you're in  CT, RI, MA, VT, NH and ME and W. Nuhsbaum  in IL, IN and KY for light microscopy surface analysis solutions. Questions? Contact us.

NEW Academic Program Scholarship Contest for 2023! We're bringing back the scholarship program that was such a success in 2022. Students already in our program can win one of five (5) $1,000 scholarships! And, the institution of the first place winner gets a free calibration of their ZEISS equipment! Learn more

Upcoming Events

Precision Machining Technology Show April 18-20, 2023, Cleveland, OH Register now

AFS Metalcasting Congress April 25-27, 2023, Cleveland, OH Register now

Rapid + TCT May 2-4, 2023, Chicago, IL Register now

Upcoming Webinars

ZEISS PRISMO Family - the new generation Tuesday, 25th April 2023, 10:00 am – 11:00 am (CDT) Register now

Missed a webinar? Find all recordings here

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Impressum Carl Zeiss Optotechnik GmbH Georg-Wiesböck-Ring 12-14 83115 Neubeuern Bayern, Germany Phone: +49 8035 8704-0 Fax: +49 8035 1010 optotechnik.metrology.de@zeiss.com Commercial register: Traunstein, HRB 4836 USt-IdNr: DE 811 218 250 Dr.-Ing. Ralf Bindel Unsubscribe | Data protection | Legal Notice