Maximize your measurement performance with the ZEISS Multi Sensor Rack 2.0

ZEISS Multi-Sensor Rack - The easiest way to modify your stylus

View Online     Quality Excellence News  June 2024       Changing Stylus Systems Made Easy   Multi Sensor Rack 2.0 offers up to 20 stylus systems storage locations with two storage strips. The CMM software recognizes through calibration where each probe system is stored and this in turn increases the efficiency of your measurements. ZEISS MSR 2.0 maximizes measurement performance with low interference contours and a wide range of configuration options.   Buy now       Metrology Specials Through June!   From software to CMM productivity packages to surface inspection systems, there are deals all around! Looking to upgrade to a newer CMM? Check out our ZEISS Buy Back Plus offer. Don't wait, these specials end June 30, 2024!   Learn more       Steel must last   As a service partner, SPC Werkstofflabor GmbH supports the steel industry in ensuring quality even under the current difficult circumstances. To do this, the accredited testing laboratory relies on a combination of light and scanning electron microscopy from ZEISS. Find out in our story, why this is the only solution for SPC.   Click here for more       Microscope or Measuring Machine? Both!    Why split metrology and microscopy when you can do both on the same device? ZEISS O-INSPECT duo makes it possible and combines a measuring machine and a microscope in one device. In case you missed the product launch at the ZEISS Quality Innovation Days, watch the recording now to discover features, software examples and a statement from one of our pilot customers.   Watch the launch webinar now       Quick and easy internal views   When the inside matters for your task, ZEISS METROTOM 1 is the right choice. This solution - powered by CT technology - offers a wide range of measurement and inspection options for plastic parts with both simple and complex structures. Get started with ZEISS METROTOM 1 and discover more at #HandsOnMetrology.   Learn more now       Finding the needle in the haystack   Tiny metallic particles can disable even huge engines by increasing the risk of oil-film breakage, leading to overheating and severe damage. Learn how the INNIO Group combats these particles and why they rely on the ZEISS EVO scanning electron microscope to find the "needle in the haystack."   Watch video       Webinar: Enhance Your Imaging Ecosystem with Electron Microscopy   Save your spot for our webinar Thursday, June 13th at 11am CDT! Learn more and register Can't make it? Register and we'll send you the recording after.       Digital Event Did you miss our digital ZEISS Quality Innovation Days 2024 or would you like to watch some of the sessions again at your leisure afterwards? Take a look at our cutting-edge keynotes featuring speakers discussing the latest trends and developments in your industry. Or learn from leading industry experts in several sessions about their valuable insights.     Watch recordings     Subscribe now   Contact us   Explore more

You can find more information on: ZEISS Website  →     Carl Zeiss Industrial Quality Solutions, LLC 6250 Sycamore Lane North, Maple Grove, MN 55369, USA Phone: +1 (800) 327-9735 info.metrology.us@zeiss.com     View Online