понедельник, 31 августа 2020 г.

ZEISS Webinars, Virtual Events & Online Training — Week of August 31 2020

 
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ZEISS Industrial Quality Solutions
Webinars, Virtual Events & Online Training
Product Launch Exclusive: MTX for ZEISS Xradia Versa
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Metrology Extension for 3D X-ray Microscopes — Adding Measurement Accuracy to X-ray Microscopy
Thursday, September 17 2020
9–10 AM (CDT)
To respond to customers' needs within industrial markets and the increasing demands for reliable measurements with 3D X-ray microscopes beyond high-resolution imaging capabilities, ZEISS is bringing a Metrology Extension (MTX) option — a combination of hardware and software — for ZEISS Xradia 620/520 Versa systems to the market. Attend this webinar to learn more about this new solution.
This Week's Webinars
Expanding the Boundaries of CT: X-Ray Microscope Imaging at Sub-Micron Resolution 
Tuesday, September 1 2020
1–2 PM (CDT)
By incorporating easy-to-use ZEISS optics into the otherwise traditional X-ray CT design, sub-micron resolution is achievable. Unlock new degrees of versatility for your scientific and industrial research with the most advanced 3D X-ray microscope models in the ZEISS Xradia Versa family.
Precision at All Altitudes: Datum Target Point Alignment Strategy for Complex Geometries
Wednesday, September 2 2020
10–11 AM (CDT)

When developing a CMM measurement program, alignments are necessary to form a stable frame of reference for the workpiece to be measured. Non-standard geometries with complex surfaces, like a jet engine turbine airfoil, can be aligned by using datum target points defined on a print or model. This webinar will demonstrate this alignment strategy on an airfoil using ZEISS CALYPSO software.
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High-resolution X-ray Imaging for Industrial Inspection: Technology to Strengthen Your Measurement Workflow at Submicron Scales
Thursday, September 3 2020
10–11 AM (CDT)
Learn how to use high-resolution X-ray imaging on a wide range of sample types, sizes and compositions to measure, analyze and inspect interior structures and hidden features non-destructively. Maximize your imaging resolution and contrast capabilities — even for large samples — for unprecedented characterization of your device's inner workings, including determining hidden defects and root causes of failure in functional parts.
Future Webinars
September 8
1–2 PM CDT
How to Reduce Scrap in Foundries: Focus on Light Metal Castings
> Register today
September 10
10–11 AM CDT
Problem Solving Using CT Scanning Technology
> Register today
Upcoming Virtual Events 

September 1–3
Charged Virtual Conference — Electric Vehicle Engineering
> Register today
September 9
SAE Tech Briefs — Alignment Strategy for Complex Part Geometries
> Register today
September 14–18
IMTS Network
> Learn more
September 21
IMTS spark
> Register today
September 28
Modern Machine Shop — How CMMs Improve Your Productivity in EDM
> Register today
Upcoming ZEISS CALYPSO Online Training Sessions
September 28–October 1
CALYPSO PiWeb Reporting — Web-Based
> Register today
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Carl Zeiss Optotechnik GmbH
Georg-Wiesböck-Ring 12-14
83115 Neubeuern
Bayern, Germany
Phone: +49 8035 8704-0
Fax: +49 8035 1010
Commercial register: Traunstein, HRB 4836
USt-IdNr: DE 811 218 250

Dr.-Ing. Ralf Bindel
Florian Linder

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