ZEISS Webinars, Virtual Events & Online Training — Week of July 27 2020 ~ Uz-Tech Мир Технологии

ZEISS Industrial Quality Solutions
Webinars, Virtual Events & Online Training

Improve your skills — Access webinars and their recordings even @home

In this email, you will find information about our upcoming free live webinars from our industrial quality solutions experts. If you are unable to attend a live event, you can check out our available catalog of on-demand webinars covering topics like:

How to solve quality assurance challenges
Electron microscopy for industrial applications
How to reduce scrap in foundries
10 reasons why you should X-ray your parts
Surface reconstruction and tool correction
Process optimization with a focus on 3D digitization
Problem solving using CT scanning technology

Can't attend a webinar live? Check out our on-demand options!

Did you miss out on any of our four Innovation Rocks 2020 programs? No worries — you can experience Rocks 1–4 on-demand on our website!

Experience ZEISS Innovation Rocks 2020 Today!

Upcoming Webinars

Automate Hand-tool Work with a Large Field of View Digital Profile Projector
Tuesday, July 28 2020

1–2 PM (CDT)

In this webinar we'll explore the potential for automating the time consuming task of hand tool measurement and manual data logging. 2D, large field of view vision systems, in many cases, can replace those hand tools used for basic dimensioning while adding the opportunity to now capture more advanced GD&T characteristics.

Closing the gap, automation of quality inspection in the manufacturing process
Wednesday, July 29 2020
1–2 PM (CDT)

Quality inspection of products via image analysis has remained mostly manual while many throughput processes have already been automated. What's missing is a highly customizable software for industrial applications. ZEISS built a software infrastructure to easily create solutions to highly customized industrial applications. Attend this webinar to learn more.

How to Reveal the Internal Structure of Objects at Sub-micron Resolution without Destroying Your Sample with RaaD
Thursday, July 30 2020
10–11 AM (CDT)

Standard CT is limited to small sample sizes when imaging at high resolution due to the geometric nature of magnification. Maintaining high resolution throughout larger samples is impossible due to the long working distances required. Resolution at a Distance (RaaD) enables high-resolution, non-destructive imaging of your sample's interior — even for large samples. Learn how RaaD overcomes the limits of Micro-CT solutions.

Upcoming Virtual Events

July 29–30

Digital Imaging and Ultrasonics for NDT 2020
> Register today

August 11–12

AM Industry Summit
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August 12

Battery Show — Digital Express Day
> Register today

Upcoming ZEISS CALYPSO Online Training Sessions

August 3–7

NEW! CALYPSO Advanced Online
> Register today

August 24–28

CALYPSO Basic Online
> Register today

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