ZEISS Weekly Webinar Update — Week of June 22 2020 ~ Uz-Tech Мир Технологии

ZEISS Industrial Quality Solutions
Weekly Webinar Update — Week of June 22 2020

Improve your skills — Access webinars and their recordings even @home

In this email, you will find information about our upcoming free live webinars from our industrial quality solutions experts. If you are unable to attend a live event, you can check out our available catalog of on-demand webinars covering topics like:

How to solve quality assurance challenges
Electron microscopy for industrial applications
How to reduce scrap in foundries
10 reasons why you should X-ray your parts
Surface reconstruction and tool correction
Process optimization with a focus on 3D digitization
Problem solving using CT scanning technology

Can't attend a webinar live? Check out our on-demand options!

Don't forget about the ZEISS Innovation Rocks 2020 program with LIVE events twice a week, webinars and all the latest news and innovations!

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This Week's Webinars

Your Solution to Implement Traceable Microscopy Workflows
Tuesday, June 23 2020
9–10 AM (CDT)

The ZEISS ZEN core Suite is the software platform for industrial microscopes. The GxP module makes all your analyses traceable and therefore compliant with regulation and certification requirements. The workflow based application product enables traceable microscopy workflows compliant with FDA 21 CFR Part 11 developed for the pharmaceutical and medical industry.

Holistic Characterization of Materials and Processes in AM using Correlative Multi-scale Multi-modal Workflow
Tuesday, June 23 2020
10–11 AM (CDT)

With additive manufacturing being adopted more widely in manufacturing, the move from prototyping to production requires greater understanding and control of several measurement and quality assurance variables. In this webinar, learn how ZEISS' holistic measuring approach utilizes a multi-scale, multi-modal workflow designed to handle the complexity of the entire AM process chain, starting from raw materials to the finished parts.

Transform Aerospace Measurement Data into Meaningful Results
Wednesday, June 24 2020

10–11 AM (CDT)

Clear interpretation of inspection results is critical in today's fast-paced Industry 4.0 manufacturing environments. ZEISS PiWeb features a unique set of tools that allow the user to combine inspection results in a simple comprehensive report. This traceable history can lead to future designs for improved performance. This webinar will feature airfoil inspection results explained and analyzed from BladePro to PiWeb by ZEISS applications experts.

How You can Measure Plastic Parts Quickly and Accurately with CT
Thursday, June 25 2020
9–10 AM (CDT)

Plastics manufacturers must meet ever increasing quality standards and timings. Their parts often need to withstand frequent mechanical stress in daily use or fulfill small tolerances. However, producing high quality plastic parts is very complex and depends on many influencing factors: from the injection mold itself, the various process parameters to the type of plastic used. In this webinar, we will show you how computed tomography (CT) can contribute to a higher quality of your plastic parts and faster quality assurance processes.

Next Week's Webinars

Transform Measurement Data into Meaningful Results
Tuesday, June 30 2020
1–2 PM (CDT)

In this webinar, we will show how ZEISS PiWeb can be used to discover weak links in your quality chain, organize and visualize quantitative and qualitative results that can be easily understood by all, and track a complete history of a part through the additive process. ZEISS PiWeb is a flexible, scalable and completely digital solution for reporting and quality for additive manufacturing.

X-ray Imaging in Sub-micron Scale — How this Technology can Strengthen Your Measurement Inspection Workflow
Wednesday, July 1 2020
9–10 AM (CDT)

Use the industry's most comprehensive 3D X-ray imaging solution for non-destructive inspection of intact samples at the submicron scale. Maximize your imaging resolution and contrast capabilities for unprecedented characterization of your sample's internal features and properties, including determining hidden defects and root causes of failure in functional structures.

Connect to Productivity from the Cloud
Thursday, July 2 2020

9–10 AM (CDT)

With ZEISS PiWeb, you can visualize and analyze measurement data. With ZEISS PiWeb cloud, measurement data can be securely stored and analyzed regardless of location.

Connect to Productivity, also @home

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